Just-Identified Versus Overidentified Two-Level Hierarchical Linear Models with Missing Data
| Year of publication: |
2007
|
|---|---|
| Authors: | Shin, Yongyun ; Raudenbush, Stephen W. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 63.2007, 4, p. 1262-1268
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946902