A Lagrangian multiplier test for market microstructure noise with applications to sampling interval determination for realized volatilities
Year of publication: |
2015
|
---|---|
Authors: | Shin, Dong Wan ; Hwang, Eunju |
Published in: |
Economics Letters. - Elsevier, ISSN 0165-1765. - Vol. 129.2015, C, p. 95-99
|
Publisher: |
Elsevier |
Subject: | Lagrangian multiplier test | Market microstructure noise | Realized volatility |
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