Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
| Year of publication: |
2005
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| Authors: | Balakrishnan, N. ; Lin, C.-T. ; Chan, P.-S. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 1, p. 27-33
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