Lifetime Data Analysis - Lognormal Selection With Applications to Lifetime Data
| Year of publication: |
2006
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|---|---|
| Authors: | John, T.T. ; Chen, P. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 1, p. 135-148
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