Lifetime Data Analysis - Testing Exponentiality Based on the Kullback-Leibler Information With the Type II Censored Data
| Year of publication: |
2005
|
|---|---|
| Authors: | Park, S. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 1, p. 22-26
|