Localization and Characterization of Latch-up Sensitive Areas using a Laser Beam: Influence on Design Rules of ICs in CMOS Technology
Year of publication: |
1993
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Authors: | Fouillat, P. ; Danto, Y. ; Dom, J.P. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 9.1993, 6, p. 477-482
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