Localization of Soft Tungsten Contact Fails with Reliability Implications by Innovative Reverse Engineering Techniques
Year of publication: |
1996
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Authors: | Touzel, J. ; Neumann, I. ; Lorenz, H. ; Boit, C. ; Körner, H. ; Schurg, S. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 12.1996, 4, p. 259-264
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