Longitudinal patent analysis for international nanotechnology development : comparison of innovative performance for the ten leading countries using patent data derrived from NBER
Wen-Chih Liao; Chun-Chou Tseng
| Year of publication: |
2014
|
|---|---|
| Authors: | Liao, Wen-chih ; Tseng, Chun-chou |
| Published in: |
International journal of management & enterprise development : IJMED. - Olney, Bucks. : Inderscience, ISSN 1468-4330, ZDB-ID 2141643-6. - Vol. 13.2014, 2, p. 188-216
|
| Subject: | patent | citations | nanotechnology | innovation | competitive advantage of nations | citation networks | perceptual maps | Patent | Nanotechnologie | Nanotechnology | Bibliometrie | Bibliometrics | Innovation | Welt | World | Vergleich | Comparison | Wettbewerbsvorteil | Competitive advantage | Internationaler Wettbewerb | International competition |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010484993