Lower confidence limits for process capability indices Cp and Cpk when data are autocorrelated
Year of publication: |
2009
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Authors: | Lovelace, Cynthia R. ; Swain, James J. ; Zeinelabdin, Hisham ; Gupta, Jatinder N.D. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 25.2009, 6, p. 663-700
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