Machine-learning-based sampling inspection under OQC capacity for real-time quality monitoring in the TFT-LCD industry
Ming-Sung Shih, James C. Chen, Tzu-Li Chen, Chih-Hsiung Chiang and Ching-Lan Hsu
| Year of publication: |
2025
|
|---|---|
| Authors: | Shih, Ming-Sung ; Chen, James C. ; Chen, Tzu-Li ; Chiang, Chih-Hsiung ; Hsu, Ching-Lan |
| Published in: |
International journal of production research. - London [u.a.] : Taylor & Francis, ISSN 1366-588X, ZDB-ID 1485085-0. - Vol. 63.2025, 6, p. 2090-2113
|
| Subject: | machine learning | quality control | feature engineering | sampling inspection | Thin film transistor-liquid crystal display | Qualitätsmanagement | Quality management | Stichprobenerhebung | Sampling | Künstliche Intelligenz | Artificial intelligence | Flüssigkristallanzeige | Liquid cristal display |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/00207543.2024.2395389 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10015422082