Measuring daily Value-at-Risk of SSEC index: A new approach based on multifractal analysis and extreme value theory
| Year of publication: |
2013
|
|---|---|
| Authors: | Wei, Yu ; Chen, Wang ; Lin, Yu |
| Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 392.2013, 9, p. 2163-2174
|
| Publisher: |
Elsevier |
| Subject: | Multifractal analysis | Volatility measurement | Extreme value theory | Value-at-Risk | Backtesting |
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