Measuring Technological Distance for Patent Mapping
Year of publication: |
2015
|
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Authors: | Yan, Bowen |
Other Persons: | Luo, Jianxi (contributor) |
Publisher: |
[2015]: [S.l.] : SSRN |
Subject: | Patent | Technischer Fortschritt | Technological change | Messung | Measurement |
Extent: | 1 Online-Ressource (28 p) |
---|---|
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | In: Forthcoming in Journal of the Association for Information Science and Technology Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 14, 2015 erstellt |
Source: | ECONIS - Online Catalogue of the ZBW |
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