Measuring the intensity of knowledge flow with patent statistics
| Year of publication: |
2002
|
|---|---|
| Authors: | Fung, Michael K. ; Chow, William W. |
| Published in: |
Economics letters. - Amsterdam [u.a.] : Elsevier, ISSN 0165-1765, ZDB-ID 7172102. - Vol. 74.2002, 3, p. 353-358
|