Modeling testing-strategies for yield enhancement of multichip module systems
| Year of publication: |
1997
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|---|---|
| Authors: | Kim ; Park ; Lombardi |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 46.1997, 2, p. 184-191
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