Modeling the bias of digital data : an approach to combining digital and survey data to estimate and predict migration trends

Yuan Hsiao, Lee Fiorio, Jonathan Wakefield, Emilio Zagheni

Year of publication:	[2020]
Authors:	Hsiao, Yuan ; Fiorio, Lee ; Wakefield, Jonathan ; Zagheni, Emilio
Publisher:	Rostock, Germany : Max Planck Institute for Demographic Research
Subject:	Digitalisierung \| Digitization \| Prognoseverfahren \| Forecasting model \| Schätztheorie \| Estimation theory \| Internationale Migration \| International migration

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