Modeling the Dependent Competing Risks With Multiple Degradation Processes and Random Shock Using Time-Varying Copulas
| Year of publication: |
2012
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| Authors: | Wang, Y ; Pham, H |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 61.2012, 1, p. 13-23
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