Modelling and resolving the joint problem of capacity expansion and allocation with multiple resources and a limited budget in the semiconductor testing industry
| Year of publication: |
2003
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|---|---|
| Authors: | Wang, K.-J. ; Hou, T.C. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 41.2003, 14, p. 3217-3236
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