Monte Carlo simulation of the transient response of single photon absorption in X-ray pixel detectors
A Monte Carlo study of the transient response of single photon absorption in X-ray pixel detectors is presented. The simulation results have been combined with Monte Carlo simulation of the X-ray photon transport and absorption, and used to estimate the image properties of a detector system, including the pixel array and readout electronics. The study includes several different simulation challenges, such as full band Monte Carlo simulation of charge transport in large devices (300μm×100μm), modelling of three-dimensional electrostatic effects using cylindrical coordinates, Monte Carlo simulation of photon transport and absorption, and a system level Monte Carlo simulation of the entire pixel detector and readout.
Year of publication: |
2003
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Authors: | Nilsson, Hans-Erik ; Dubaric, Ervin ; Hjelm, Mats ; Englund, Urban |
Published in: |
Mathematics and Computers in Simulation (MATCOM). - Elsevier, ISSN 0378-4754. - Vol. 62.2003, 3, p. 471-478
|
Publisher: |
Elsevier |
Subject: | Monte Carlo methods | X-ray | Pixel detector | Semiconductor simulation |
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