More powerful panel data unit root tests with an application to mean reversion in real exchange rates
| Year of publication: |
2004
|
|---|---|
| Authors: | Smith, L.Vanessa ; Leybourne, Stephen ; Kim, Tae-Hwan ; Newbold, Paul |
| Published in: |
Journal of applied econometrics. - Chichester : Wiley-Blackwell, ISSN 0883-7252, ZDB-ID 6339414. - Vol. 19.2004, 2, p. 147-170
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