Multinomial VAR Backtests : A Simple Implicit Approach to Backtesting Expected Shortfall
| Year of publication: |
2017
|
|---|---|
| Authors: | Kratz, Marie |
| Other Persons: | Lok, Yen (contributor) ; McNeil, Alexander J. (contributor) |
| Publisher: |
[2017]: [S.l.] : SSRN |
| Subject: | Risikomaß | Risk measure | Statistischer Test | Statistical test | VAR-Modell | VAR model | Theorie | Theory | Prognoseverfahren | Forecasting model | Risikomanagement | Risk management | Schätzung | Estimation | Messung | Measurement |
| Extent: | 1 Online-Ressource (32 p) |
|---|---|
| Series: | |
| Type of publication: | Book / Working Paper |
| Language: | English |
| Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments November 1, 2016 erstellt |
| Other identifiers: | 10.2139/ssrn.2898688 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
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