Multivariate analysis-based image enhancement model for machine vision inspection
Year of publication: |
2011
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Authors: | Wang, Chien-Chih ; Jiang, Bernard ; Chou, Yueh-Shia ; Chu, Chien-Cheng |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 49.2011, 10, p. 2999-3022
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