NETWORK-SYSTEM COMPUTATION AND ANALYSIS - Lifetime-Characteristics and Inspection-Schemes for Lévy Degradation Processes
| Year of publication: |
2000
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|---|---|
| Authors: | Yang, Y. ; Klutke, G.-A. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 49.2000, 4, p. 377-382
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