Network & System Reliability - Some Aging Properties of the Residual Life of k-out-of-n, Systems
| Year of publication: |
2006
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| Authors: | Li, X. ; Zhao, P. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 3, p. 535-541
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