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Nonparametric tests for common values at first-price sealed bid auctions

Philip A. Halle; Han Hong; Matthew Shum
Year of publication:
2003
Authors: Haile, Philip A. ; Hong, Han ; Shum, Matthew
Publisher: Cambridge, Mass. : National Bureau of Economic Research
Subject: Auktion | Auction | Nichtparametrisches Verfahren | Nonparametric statistics
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