On a Likelihood-Based Goodness-of-Fit Test of the Beta-Binomial Model
| Year of publication: |
2000
|
|---|---|
| Authors: | Garren, Steven T. ; Smith, Richard L. ; Piegorsch, Walter W. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 56.2000, 3, p. 947-949
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010948066