On the distribution of the estimated process yield index Spk
Year of publication: |
2002
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Authors: | Lee, J.C. ; Hung, H.N. ; Pearn, W.L. ; Kueng, T.L. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 18.2002, 2, p. 111-116
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