On the estimation of integrated volatility in the presence of jumps and microstructure noise
Year of publication: |
2020
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Authors: | Brownlees, Christian ; Nualart, Eulalia ; Sun, Yucheng |
Published in: |
Econometric reviews. - Philadelphia, Pa. : Taylor & Francis, ISSN 1532-4168, ZDB-ID 2041746-9. - Vol. 39.2020, 10, p. 991-1013
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Subject: | Integrated volatility | jumps | market microstructure noise | realized kernel estimator | two-scales realized volatility estimator | Volatilität | Volatility | Marktmikrostruktur | Market microstructure | Schätztheorie | Estimation theory | Noise Trading | Noise trading | Nichtparametrisches Verfahren | Nonparametric statistics | Kapitaleinkommen | Capital income | Stochastischer Prozess | Stochastic process | Zeitreihenanalyse | Time series analysis |
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