Optical and microwave properties of metal-insulator thin films: possibility of light localization
High frequency response (optical, infrared and microwave) of thin metal-dielectric inhomogeneous films is studied. We propose a new approach based on a direct solution of Maxwell's equations without having to invoke the quasi-static approximation. Our theory reproduces most of the known experimental results including the anomalous absorption near a percolation threshold. For the strong skin effect case or for superconducting-dielectric films we predict an electromagnetic wave localisation at the percolation threshold.
Year of publication: |
1994
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Authors: | Sarychev, Andrey K. ; Bergman, David J. ; Yagil, Yoad |
Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 207.1994, 1, p. 372-378
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Publisher: |
Elsevier |
Saved in:
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