Optical and morphological characterisation of low refractive index materials for coatings on solar collector glazing

Nanostructured coatings based on the elements Si, O, Mg, and F have been deposited as thin films by sol–gel dip-coating in a particle-free atmosphere. The refractive index of the prepared SiO2 and quaternary Mg–F–Si–O thin films has been determined from spectrophotometric and ellipsometric data. The morphology of those thin films has been observed by TEM.

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Year of publication:	2013
Authors:	Hody-Le Caër, V. ; De Chambrier, E. ; Mertin, S. ; Joly, M. ; Schaer, M. ; Scartezzini, J.-L. ; Schüler, A.
Published in:	Renewable Energy. - Elsevier, ISSN 0960-1481. - Vol. 53.2013, C, p. 27-34
Publisher:	Elsevier
Subject:	Anti-reflection \| Nanoporous \| Nanocomposite \| Sol–gel \| Ellipsometry \| Microscopy

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10011045226