Optimal Bayesian fault prediction scheme for a patially observable system subject to random failure
Michael Jong Kim; Rui Jiang; Viliam Makis; Chi-Guhn Lee
| Year of publication: |
2011
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|---|---|
| Authors: | Kim, Michael Jong ; Jiang, Rui ; Makis, Viliam ; Lee, Chi-guhn |
| Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 214.2011, 2 (16.10.), p. 331-339
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| Subject: | Bayes-Statistik | Bayesian inference | Theorie | Theory | Prognoseverfahren | Forecasting model | Stochastischer Prozess | Stochastic process |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009307386