Optimal burn-in procedure for mixed populations based on the device degradation process history
Year of publication: |
2016
|
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Authors: | Cha, Ji Hwan ; Pulcini, Gianpaolo |
Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 251.2016, 3 (16.6.), p. 988-998
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Subject: | Burn-in | Degradation process | Non-homogeneous gamma process | Mixed population | Cost optimization |
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