Optimal sample size allocation for tests with multiple levels of stress with extreme value regression
Year of publication: |
2007
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Authors: | Ng, H.K.T. ; Balakrishnan, N. ; Chan, P.S. |
Published in: |
Naval research logistics : an international journal. - New York, NY : Wiley, ISSN 0894-069X, ZDB-ID 3924944. - Vol. 54.2007, 3, p. 237-249
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Saved in:
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