Optimum Design of Accelerated Life Tests Under Two Failure Modes
| Year of publication: |
2007
|
|---|---|
| Authors: | Kim, C.M. |
| Published in: |
International journal of industrial engineering : applications and practice. - Cincinnati, ISSN 1072-4761, ZDB-ID 13637046. - Vol. 14.2007, 4, p. 362-371
|