Original Papers - Surface Defect Recognition Using Multilayer Perceptron and C-Means Algorithm
| Year of publication: |
2001
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|---|---|
| Authors: | Kim, T. ; Kumara, S.R.T. |
| Published in: |
International journal of industrial engineering : applications and practice. - Cincinnati, ISSN 1072-4761, ZDB-ID 13637046. - Vol. 8.2001, 1, p. 52-61
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