Overcoming inefficiencies in patent licensing : a method to assess patent essentiality for technical standards
Rudi Bekkers, Elena M. Tur, Joachim Henkel, Tommy van der Vorst, Menno Driesse, Jorge L. Contreras
| Year of publication: |
2022
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|---|---|
| Authors: | Bekkers, Rudi ; Tur, Elena M. ; Henkel, Joachim ; Vorst, Tommy van der ; Driesse, Menno ; Contreras, Jorge L. |
| Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 51.2022, 10, p. 1-13
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| Subject: | Essentiality | Patent licensing | Standard essential patents | Technical standards | Patent | Standardisierung | Standardization | Lizenz | Licence | Patentrecht | Patent law | Theorie | Theory | Welt | World |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.respol.2022.104590 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10013555003