PAPERS - A Reliability Test-Plan for Series Systems With Components Having Stochastic Failure Rates
| Year of publication: |
2002
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|---|---|
| Authors: | Nair, J.H. ; Sabnis, S.V. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 51.2002, 1, p. 17-22
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