PAPERS - Analysis of Stratified Testing for Multichip Module Systems
| Year of publication: |
2002
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| Authors: | Park, N. ; Lombardi, F. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 51.2002, 1, p. 100-110
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