Parametric Reliability - Data Mapping and the Prediction of Common Cause Failure Probability
| Year of publication: |
2005
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|---|---|
| Authors: | Xie, L. ; Zhou, J. ; Wang, X. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 2, p. 291-296
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