Partisan patent examiners? : exploring the link between the political ideology of patent examiners and patent office outcomes
Year of publication: |
2023
|
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Authors: | Raffiee, Joseph ; Teodoridis, Florenta ; Fehder, Daniel |
Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 52.2023, 9, p. 1-13
|
Subject: | Patents | Patent examiners | Political ideology | Innovation | Patent | Patentrecht | Patent law | Ideologie | Ideology |
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