Patent value analysis using deep learning models : the case of IoT technology mining for the manufacturing industry
Amy J.C. Trappey, Charles V. Trappey, Usharani Hareesh Govindarajan and John J.H. Sun
| Year of publication: |
2021
|
|---|---|
| Authors: | Trappey, Amy J. C. ; Trappey, Charles V. ; Govindarajan, Usharani Hareesh ; Sun, John J. H. |
| Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 68.2021, 5, p. 1334-1346
|
| Subject: | Business intelligence | deep neural network (DNN) | dynamic indicator selection | Internet of Things (IoT) | patent valuation | Internet der Dinge | Internet of things | Patent | Künstliche Intelligenz | Artificial intelligence | Industrie | Manufacturing industries | Neuronale Netze | Neural networks |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1109/TEM.2019.2957842. [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012659372