Pattern recognition and artificial intelligence : proceedings of the Joint Workshop on Pattern Recognition and Artificial Intelligence, held at Hyannis, Mass., June 1 - 3, 1976
Year of publication: |
1976
|
---|---|
Other Persons: | Chen, Chi-Hau (contributor) |
Institutions: | Joint Workshop on Pattern Recognition and Artificial Intelligence <1976, Hyannis, Mass.> (contributor) |
Publisher: |
New York [u.a.] : Acad. Pr. |
Subject: | Künstliche Intelligenz | Zeichenerkennung | Aufsatzsammlung | Kongress | Hyannis <Mass., 1976> | Mustererkennung |
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