Pattern recognition for evaluator errors in a credit scoring model for technology-based SMEs
| Year of publication: |
2012
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|---|---|
| Authors: | Sohn, S Y ; Doo, M K ; Ju, Y H |
| Published in: |
Journal of the Operational Research Society : OR. - Basingstoke, Hampshire : Palgrave, ISSN 0030-3623, ZDB-ID 7160331. - Vol. 63.2012, 8 (16.8.), p. 1051-1065
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