Physics of Failure - Effect of CVD -- SiO2 Film on Reliability of GaAs MESFET With Ti-Pt-Au Gate Metal
| Year of publication: |
2005
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| Authors: | Saito, Y. ; Hashinaga, T. ; Nakajima, S. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 1, p. 79-82
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