Positive Definiteness via Off-diagonal Scaling of a Symmetric Indefinite Matrix
Year of publication: |
2011
|
---|---|
Authors: | Bentler, Peter ; Yuan, Ke-Hai |
Published in: |
Psychometrika. - Springer. - Vol. 76.2011, 1, p. 119-123
|
Publisher: |
Springer |
Subject: | indefinite matrix | eigenvalues | minimum trace factor analysis |
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