Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-Examinations and European Patent Oppositions
| Year of publication: |
2002-08-05
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| Authors: | Graham, Stuart J. H. ; Hall, Bronwyn H. ; Harhoff, Dietmar ; Mowery, David C. |
| Institutions: | Institute of Business and Economic Research (IBER), Walter A. Haas School of Business |
| Subject: | patent system | litigation | intellectual property | opposition | re-examination | Business | Social and Behavioral Sciences | Technology and Innovation |
| Extent: | application/pdf |
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| Series: | |
| Type of publication: | Book / Working Paper |
| Notes: | The text is part of a series Department of Economics, UCB |
| Source: |
Persistent link: https://www.econbiz.de/10010677916