Predicting patent quality based on machine learning approach
Year of publication: |
2024
|
---|---|
Authors: | Erdogan, Zulfiye ; Altuntas, Serkan ; Dereli, Türkay |
Published in: |
IEEE transactions on engineering management : EM ; a publication of the IEEE Engineering Management Society. - New York, NY : IEEE, ISSN 1558-0040, ZDB-ID 2021741-9. - Vol. 71.2024, p. 3144-3157
|
Subject: | Analytic hierarchy process (AHP) | machine learning | multilayer perceptron | patent indices | supervised learning algorithms | Künstliche Intelligenz | Artificial intelligence | Patent | AHP-Verfahren | AHP approach | Algorithmus | Algorithm | Prognoseverfahren | Forecasting model | Lernprozess | Learning process |
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