Probability-enhanced sufficient dimension reduction for binary classification
| Year of publication: |
2014
|
|---|---|
| Authors: | Shin, Seung Jun ; Wu, Yichao ; Zhang, Hao Helen ; Liu, Yufeng |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 70.2014, 3, p. 546-555
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946487