Profile monitoring for a binary response
| Year of publication: |
2009
|
|---|---|
| Authors: | Yeh, Arthur ; Huwang, Longcheen ; Li, Yu-Mei |
| Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 41.2009, 11, p. 931-941
|