Random effects model for credit rating transitions
Year of publication: |
2008
|
---|---|
Authors: | Kim, Yoonseong ; Sohn, So Young |
Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 184.2008, 2 (16.1.), p. 561-573
|
Subject: | Kreditwürdigkeit | Credit rating | Markov-Kette | Markov chain | Theorie | Theory | Mehrebenenanalyse | Multi-level analysis |
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