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Electrical overstress and electrostatic discharge
Diaz, C., (1995)
MICROCIRCUITS -- DESIGN, MANUFACTURE, TEST, USE: Simulation of hot-carrier induced MOS circuit degradation for VLSI reliability analysis
Leblebici, Y., (1994)
Wind power technology development, transfer and commercialisation, along with construction of a wind turbine test site in Korea
Kim, S. H., (2005)